Eindrapportage van het TFF project RPAS meets Fire Fighting van het lectoraat AFT.
MULTIFILE
Eindrapportage van het TFF project RPAS meets Fire Fighting van het lectoraat AFT.
MULTIFILE
In het kader van actualisering van voorlichtingspublicaties (een samenwerkingsverband tussen FDP, FME, NIL, NIMR, Syntens en TNO Industrie & Techniek), is deze voorlichtingspublicatie aangepast aan de huidige stand der techniek. De originele publicatie is in 1991 tot stand gekomen door samenwerking van de Vereniging FME/CWM en het Nederlands Instituut voor Lastechniek in het kader van het FME/NIL project "Het lijmen als verbindingstechniek"
Size measurement plays an essential role for micro-/nanoparticle characterization and property evaluation. Due to high costs, complex operation or resolution limit, conventional characterization techniques cannot satisfy the growing demand of routine size measurements in various industry sectors and research departments, e.g., pharmaceuticals, nanomaterials and food industry etc. Together with start-up SeeNano and other partners, we will develop a portable compact device to measure particle size based on particle-impact electrochemical sensing technology. The main task in this project is to extend the measurement range for particles with diameters ranging from 20 nm to 20 um and to validate this technology with realistic samples from various application areas. In this project a new electrode chip will be designed and fabricated. It will result in a workable prototype including new UMEs (ultra-micro electrode), showing that particle sizing can be achieved on a compact portable device with full measuring range. Following experimental testing with calibrated particles, a reliable calibration model will be built up for full range measurement. In a further step, samples from partners or potential customers will be tested on the device to evaluate the application feasibility. The results will be validated by high-resolution and mainstream sizing techniques such as scanning electron microscopy (SEM), dynamic light scattering (DLS) and Coulter counter.
